A Conformal Mapping-Based Broadband Method to Extract Propagation Properties of Dielectrics Using Coplanar Waveguides With Air Pockets

In recent years, advances in material science for high-frequency electronics have generated novel materials that offer superior performance. Additive manufacturing (AM) has expanded the frontiers of microwave going beyond flat geometries and unique properties such as graded permittivity materials. Accurate electromagnetic (EM) characterization AM remains challenging given printing volume constraints processes, traditional EM property extraction techniques often require electrically large samples. Furthermore, loss typically cannot differentiate dielectric conductor losses waveguides. This paper presents a conformal mapping-based technique using coplanar waveguides (CPW) with air pockets allows extraction. The underlying principle is to use set CPWs different slot depths extract behavior function depth. A new loss-slot rate metric introduced decouple structure. theoretical foundation used develop physical-mathematical model verified simulations experiments range 2.33–29, tangents 0.02–0.055. average error equivalent capacitance CPW (CPW-AP) between presented simulated or measured data 2.4% all studied cases. experimental confirmation performed traditionally manufactured FR-4 additively yttria-stabilized zirconia (YSZ) dielectrics up 10 GHz.